Optical Metrology and a Digital Optical Technologies (DOT)
Veranstaltung
- Titel:
- Optical Metrology and a Digital Optical Technologies (DOT)
- Wann:
- Mo, 26. Juni 2017 - Do, 29. Juni 2017
- Wo:
- Neue Messe München - München, Bayern
- Kategorie:
- Info extern
Beschreibung
We would like to draw your attention to our well-known 2-year SPIE conference
Optical Metrology and a new SPIE conference Digital Optical Technologies (DOT)
both co-located with Laser Munich in Munich, Germany, June 26-29, 2017, and take this opportunity to invite you to submit and present your latest research at this high-quality meetings.
The conferences links can be found by following links:
http://spie.org/conferences-and-exhibitions/optical-metrology
https://spie.org/conferences-and-exhibitions/digital-optical-technologies
Veranstaltungsort
- Standort:
- Neue Messe München - Webseite
- Straße:
- Am Messesee
- Postleitzahl:
- 81829
- Stadt:
- München
- Bundesland:
- Bayern
- Land:
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