• Kontaktperson: Gerard van den Eijkel
  • E-Mail Kontaktperson: Diese E-Mail-Adresse ist vor Spambots geschützt! Zur Anzeige muss JavaScript eingeschaltet sein.
  • Telefon: +1 (585) 256-6540
  • Strasse: 1040 University Ave
  • PLZ: 14607
  • Stadt: Rochester, NY,
  • Webseite: https://www.qedtech.com
  • E-Mail: Diese E-Mail-Adresse ist vor Spambots geschützt! Zur Anzeige muss JavaScript eingeschaltet sein.

QED Technologies – Nanomefos Metrology Systems (formerly Dutch United Instruments)

 

QED Technologies

QED Technologies™ is a global leader in advanced manufacturing and metrology solutions for precision optics. Headquartered in Rochester, New York, the company develops technologies that enable the production and measurement of the world’s most demanding optical components for industries such as semiconductors, aerospace, defense, and research.

Through the acquisition of Dutch United Instruments (DUI), QED Technologies has expanded its metrology portfolio with the NMF™ platform, a high-precision system designed for fast and accurate surface metrology of complex optics directly on the workshop floor.

The NMF platform provides non-contact measurement of optical surfaces, including flat, spherical, aspheric, and freeform geometries, with nanometer-level accuracy. It enables efficient measurement of complex optical components ranging from convex to concave surfaces and supports modern optical manufacturing workflows.

 

Key Features
  • Universal and versatile, no setup changes for measuring a broad range of surface shapes such as flat, sphere, asphere and freefrom
  • Robust against vibration with closed loop metrology system made of best components available
  • Unique non-contact confocal probe with both large NA and axial range, which is capable of measuring freefrom with departure from best-fit asphere up to 5 mm PV and +-5° local slope deviation
  • Ease of use with intuitive user interface
  • Fast measurement with typical round pieces including freefrom measured in less than 10 mins
  • High-density error map and micrometre point spacing line scans, including absolute radius error
  • High accuracy with total measurement uncertainty less than 15 nm and repeatability below 1 nm rms
  • Product portfolio for various size of optics including NMF350 S, NMF600 S, NMF800 S and NMF1000 S as well as custom metrology systems

DUI QED Bild 4 NMF 350 1

By integrating the NMF platform into its portfolio, QED Technologies continues to strengthen its capabilities in optical manufacturing and metrology alongside technologies such as Magnetorheological Finishing (MRF™) and Subaperture Stitching Interferometry (SSI™).

DUI QED Bild 5 NMF 800 Feature 1

With QED Technologies’ global service network, NMF customers benefit from worldwide applications support, field service engineers, and expanded distribution across major optics markets.