SPIE Conference Optical Metrology 2011

Co-located with Laser 2011 in Munich, Germany, this symposium provides an excellent opportunity to connect with engineers, researchers, and developers from Europe and beyond.

SPIE Optical Metrology is the premier conference in Europe that brings together scientists, engineers, researchers, and applications or product developers engaged in optical metrology, optical measurement systems, and optics for arts, architecture, and archaeology.

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